08/01/2006 Press Release NVision 40: High-end multi-functional CrossBeam® workstation for Materials Analysis, Semiconductor Manufacturing and Life Science Applications
07/13/2006 Press Release XVision 300 FIB/SEM Nano-Scale Inspection and Defect Analysis Tool launched Carl Zeiss SMT and SII NanoTechnology present first jointly developed solution for 300mm wafer process control
04/11/2006 Press Release SII Nano Technology Releases "SmartMRC" Mask Rule Checker New product added to SIINT's mask data preparation lineup
03/16/2006 Press Release Carl Zeiss NTS and SII NanoTechnology announce global strategic alliance on Nanotechnology Solutions
03/14/2006 Press Release Seiko Instruments Singapore Honored with IHQ Award on Its 30th Anniversary Seiko Instruments Inc Establishes New R&D Center in Singapore
03/02/2006 Press Release SII Developed an Experimental Watch for Communication with BluetoothTM Mobile Phones Simulating the BT Watch Standard MCPC(*1) TR-006 Ver.1.0(*2)
10/26/2005 Press Release SII NanoTechnology Announces Acquisition of U.S. Radiant Detector Technologies' X-ray Detector Business