SII NanoTechnology Inc., a subsidiary of Seiko Instruments Inc. (SII), received accreditation from the Japan Accreditation Board for Conformity Assessment (JAB) for its Makuhari laboratory on September 29, 2004, and is fully compliant with ISO/IEC17015(*1), the international laboratory accreditation standard.
SII NanoTechnology was certified for its proprietary in house standards and test methods entitled “Test Methods for Heavy Metal Concentration in Plastic by ICP Optical Emission Spectrometry.” It is now able to provide analytical valuations related to the content of cadmium (Cd), lead (Pb) and chrome (Cr) in plastic (polyvinyl chloride and polyethylene) compliant with international standards. As a result, SII NanoTechnology not only ensures the traceability(*2) of analytical valuations provided by its laboratory, but also offers a “One-Stop-Testing,” in which the results of an implemented test are internationally accepted without the need for re-inspection.
In the European Union (EU), the “Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment” (RoHS Directive) was issued in 2003 as part of a regional environmental policy, requiring instrument manufacturers to intensify inspections for hazardous substances contained in purchased goods, starting at the procurement stage. While simple and quick X-ray fluorescent analysis has often been used for preliminary testing of such substances, preparation of reference materials for determining the content of hazardous metals defined in the RoHS Directive and verifying assessment accuracy has been expected. To respond to this need, SII NanoTechnology has engaged in the production of reference materials and with its accredited laboratory assigns standard values to those reference materials. It is now able to provide reference materials of high reliability.
(*1) ISO/IEC17025
General requirements for laboratory and calibration service performance, which define the requirements for testing and calibration, including sampling. Includes testing and calibration performed using methods defined in standards, methods not defined in standards, and methods developed by laboratories and calibration services.
(*2) Traceability
The property of the result of a measurement or the value of a standard whereby it can be related to stated references, usually national or international standards, through an unbroken chain of comparisons all having stated uncertainties.
[ISO/IEC17025]
Scope of accreditation: Chemical testing
Accreditation number: RTL01550
Accredited organization: SII NanoTechnology Inc., Makuhari Laboratory
Date of accreditation: September 29, 2004
Accreditation agency: The Japan Accreditation Board for Conformity Assessment
[About SII NanoTechnology]
SII NanoTechnology, a subsidiary of Seiko Instruments, Inc., is a world leader in the development of advanced, cutting edge measurement and analysis instruments. Its headquarters are located in Chiba prefecture, Japan. The company, the former Scientific Instruments Division of Seiko Instruments Inc., was established in December 2003. It was the first Japanese company to produce SPM and Focused Ion Beam (FIB) Systems. The company’s products line-up also includes XRF Analyze, XRF Coating Thickness Gauge, Thermal Analysis System, ICP-OES, ICP-MS and Mask Repair System. Many of these products are utilized to support leading edge research and development.
Additional information about the company is available on the internet at http://www.siint.com/en
Contact Information
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Seiko Instruments Inc.
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Fax:+81-43-211-8011
Product Inquiry
SII Nanotechnology Inc.
Kawada
Application Engineering Section
Fax:043-211-8067