Seiko Instruments Inc.

SEIKO

&nbdp;
  • 日本語

Seiko Instruments Inc.

  • Home
  • Products
  • SII Technology
  • Sustainability
  • Corporate profile
  • Contact Us
  • For Business
    • Electronic Components
      • Quartz Crystal
      • Micro Battery
      • Silver Oxide Battery
      • Superior performance Co-Ni Alloy Product (SPRON)
      • Rare Earth Magnet (DIANET)
    • Printers
      • Thermal Printer
      • Inkjet Printhead
    • Machine Tools / Precision Parts
      • Grinder
      • FA System
      • Precision Turned Parts
  • For Personal
    • Miniature Ball Bearing
    • child-nav-11 child
  • Home
  • News

News

RSS feed registration

SII and SII Micro Parts Ltd. Merger

09/10/2007

Press Release

SII and SII Micro Parts Ltd. Merger

Change in Management

04/26/2007

Press Release

Change in Management

World’s Smallest Micromotor, 0.95mm in Diameter, Successfully Developed

04/11/2007

Press Release

World's Smallest Micromotor, 0.95mm in Diameter, Successfully Developed

Seiko Instruments Allocates New Shares to Third Parties

03/29/2007

Press Release

Seiko Instruments Allocates New Shares to Third Parties

Civil Lawsuit Filed against Mr. Junichi Hattori, the Former SII Chairman

03/14/2007

Press Release

Civil Lawsuit Filed against Mr. Junichi Hattori, the Former SII Chairman

Miyakubo Facility Soil Pollution Investigation Results and Countermeasures

03/12/2007

Press Release

Miyakubo Facility Soil Pollution Investigation Results and Countermeasures

Release the European language pages of “SII-IC.COM”

01/08/2007

Topics

Release the European language pages of “SII-IC.COM”

Change in Management

11/20/2006

Press Release

Change in Management

Change in Management

11/17/2006

Press Release

Change in Management

NVision 40: High-end multi-functional CrossBeam® workstation for Materials Analysis, Semiconductor Manufacturing and Life Science Applications

08/01/2006

Press Release

NVision 40: High-end multi-functional CrossBeam® workstation for Materials Analysis,
Semiconductor Manufacturing and Life Science Applications

XVision 300 FIB/SEM Nano-Scale Inspection and Defect Analysis Tool launched Carl Zeiss SMT and SII NanoTechnology present first jointly developed solution for 300mm wafer process control

07/13/2006

Press Release

XVision 300 FIB/SEM Nano-Scale Inspection and Defect Analysis Tool launched
Carl Zeiss SMT and SII NanoTechnology present first jointly developed solution for 300mm wafer process control

Change in Management

05/26/2006

Press Release

Change in Management

Change in Management

05/19/2006

Press Release

Change in Management

SII Nano Technology Releases “SmartMRC” Mask Rule Checker New product added to SIINT’s mask data preparation lineup

04/11/2006

Press Release

SII Nano Technology Releases "SmartMRC" Mask Rule Checker
New product added to SIINT's mask data preparation lineup

Carl Zeiss NTS and SII NanoTechnology announce global strategic alliance on Nanotechnology Solutions

03/16/2006

Press Release

Carl Zeiss NTS and SII NanoTechnology announce global strategic alliance on Nanotechnology Solutions

Seiko Instruments Singapore Honored with IHQ Award on Its 30th Anniversary  Seiko Instruments Inc Establishes New R&D Center in Singapore

03/14/2006

Press Release

Seiko Instruments Singapore Honored with IHQ Award on Its 30th Anniversary
Seiko Instruments Inc Establishes New R&D Center in Singapore

SII Developed an Experimental Watch for Communication with BluetoothTM Mobile Phones  Simulating the BT Watch Standard MCPC(*1) TR-006 Ver.1.0(*2)

03/02/2006

Press Release

SII Developed an Experimental Watch for Communication with BluetoothTM Mobile Phones
Simulating the BT Watch Standard MCPC(*1) TR-006 Ver.1.0(*2)

SII NanoTechnology and Carl Zeiss announce Sales Alliance

01/17/2006

Press Release

SII NanoTechnology and Carl Zeiss announce Sales Alliance

SII NanoTechnology Establishes a Wholly-owned US Subsidiary

10/26/2005

Press Release

SII NanoTechnology Establishes a Wholly-owned US Subsidiary

SII NanoTechnology Announces Acquisition of U.S. Radiant Detector Technologies’ X-ray Detector Business

10/26/2005

Press Release

SII NanoTechnology Announces Acquisition of U.S. Radiant Detector Technologies' X-ray Detector Business

Prev

  • 1
  • …
  • 4
  • 5
  • 6
  • 7
  • 8
  • …
  • 12

Next

News

  • Press Release
  • Topics
  • Events

Archives

  • 2024
  • 2023
  • 2022

Go to top of page

  • About SII
    • Message
    • Outline
    • History
    • SII Group/Japan
    • SII Group/Worldwide
    • Core Values
    • Corporate Governance
    • SII Group Charter of Corporate Behavior
    • Code of Conduct
    • SII Technology
    • Press Release
    • Sustainability
    • Seiko Group

Copyright © Seiko Instruments Inc. 2025, All Rights Reserved.

  • SII Home
  • Terms of Use
  • Sitemap
  • Privacy Policy